SENTECH Seminar on Ellipsometry and Reflectometry 2015
A one day seminar on the topic “Ellipsometry and Reflectometry for the characterization of thin films” was organized by SENTECH in Stuttgart, June 18, 2015. The seminar was focussed on innovations of SENTECH metrology as well as on new developments in science and technology. Invited speakers and SENTECH experts addressed topics from in situ process control, over nanotechnology to photovoltaics.
(firmenpresse) - The talks included guest speakers from different universities and institutions. One of the numerous highlights was the presentation on the topic “In situ measurements in gas environment with ellipsometry” by Brecht Vallaey, University Leuven. He presented on characterizing the interaction between gas and surfaces for food packaging applications using a SENpro spectroscopic ellipsometer with gas cell.
Particularly interesting were the presentations on optical characterization of nano-structured surfaces by Bernd Bodermann from PTB and Ingo Dirnstorfer from Namlab. They showed how to determinate structure parameters from gratings using ellipsometry and special software extensions.
Sessions given by SENTECH experts focussed, for example, on the new SENTECH ALD Real Time Monitor. Dr Kärkkänen, ALD specialist at SENTECH, presented on the effective optimization of ALD processes parameters using the ALD Real Time Monitor.
After the seminar speakers and audience got together for networking and discussion about practical applications and techniques. The SE 800 PV, the SENTECH spectroscopic ellipsometer for photovoltaic development and engineering applications, was demonstrated in a hands-on-ellipsometry. The event created an excellent opportunity for all attendants to share their practical experiences and to network.
Wolfgang Wagenseil, Sales Manager at SENTECH organized this event. He was delighted by the excellent feedback of the participants: “The participants got to know more about the recent advances of charactering materials with SENTECH ellipsometry and reflectometry. They especially enjoyed fruitful discussions about the given presentations.” If you want to learn more about upcoming SENTECH seminars contact us!
Themen in dieser Pressemitteilung:
ellipsometry
ellipsometer
spectroscopic-ellipsometer
spectroscopic-ellipsometry
thin-film-measurement
thin-film
thin-films
layer
layer-measurements
metrology
thin-film-metrology
nir-ellipsometry
Unternehmensinformation / Kurzprofil:
SENTECH offers leading edge ellipsometers for thin film metrology and plasma equipment for etching and deposition.
Datum: 31.07.2015 - 08:23 Uhr
Sprache: Deutsch
News-ID 1376085
Anzahl Zeichen: 0
contact information:
Contact person: Pia Romanowski
Town:
Berlin
Phone: 49 30 63 92 55 20
Kategorie:
Optical Components
Anmerkungen:
Diese Pressemitteilung wurde bisher 472 mal aufgerufen.
Die Pressemitteilung mit dem Titel:
"SENTECH Seminar on Ellipsometry and Reflectometry 2015
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SENTECH Instruments GmbH (Nachricht senden)
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