Application-oriented thin film measurement seminar
SENTECH as a worldwide leader in thin film measurement and plasma process technology organizes application oriented seminars on a regular basis. The most recent seminar “Ellipsometry and Reflectometry for characterizing thin films” was on thin film measurement.
(firmenpresse) - More than 20 participants mainly from industry as well as SENTECH users were part of the audience. The seminar took place on 24th of June, 2014 in Munich.Recent topics of thin film measurement like organic layers and organic solar cells were discussed within the numerous presentations. SENTECH`s latest developments – the measurement of 16 Müller-Matrix-Elements and scatterometry – were especially focused on. One of the outstanding highlights of the seminar was the presentation on “Measuring optical properties of organic layers for characterizing OLEDs” by Christian Mayr from the University of Augsburg. In this application, spectroscopic ellipsometry is applied to estimate the later efficiency of an organic LED. A presentation by M. Baklanov from IMEC addressed the “characterization of coatings with huge internal surfaces by using ellipsometry”.
In addition to the talks, the audience highly appreciated the demonstration of SENTECH`s ellipsometers and reflectometers for thin film measurement. SENTECH demonstrated how the step scan analysator in combination with high sensitive detector-arrays allows the measurement of rough and textured surfaces.
The active exchange with users and experts in thin film measurement is an important aspect for SENTECH. Customer oriented research and development in thin film measurement as well as in plasma process technology is our dedication. Hence, we are organizing innovative seminars several times a year. If you want to learn more about upcoming SENTECH Seminars and workshops, contact us!
Themen in dieser Pressemitteilung:
metrology-seminar
thin-film-measurement-seminar
metrology-workshop
thin-film-measurement
thin-film
thin-films
metrology
metrology-tools
measurment-tools
ellipsometer
reflectometer
spectroscopic-ellipsometry
ellipsometry
reflectometers
Unternehmensinformation / Kurzprofil:
SENTECH Instruments develops, manufactures, and sells worldwide advanced quality instrumentation for Plasma Process Technology, Thin Film Measurement, and Photovoltaics.
The medium-sized company founded in 1990 has grown fast over the last decades and has today 60 employees. SENTECH is located in Berlin, capital of Germany, and has moved to its own company building in 2010 in order to expand its production facilities.
SENTECH plasma etchers and deposition systems including ALD support leading-edge applications. They feature high flexibility, reliability, and low cost of ownership. SENTECH’s plasma products are developed and manufactured in-house and thus allow for customer-specific adaptations. More than 300 units have been sold to research facilities and industry for applications in nanotechnology, micro-optics, and optoelectronics.
Datum: 09.07.2014 - 06:40 Uhr
Sprache: Deutsch
News-ID 1300249
Anzahl Zeichen: 0
contact information:
Contact person: Pia Romanowski
Town:
Berlin
Phone: +49 30 63 92 55 20
Kategorie:
Optical Components
Anmerkungen:
Diese Pressemitteilung wurde bisher 319 mal aufgerufen.
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"Application-oriented thin film measurement seminar
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