MVTS Technologies Acquires Electroglas Wafer Prober Assets From Zenovus Pte. Ltd.
(firmenpresse) - CARLSBAD, CA -- (Marketwire) -- 01/08/13 -- Global service and technology solutions provider has acquired the Electroglas wafer prober assets from Pte. Ltd. and will now provide global sales and service for the 4080, 4090, 4090u, 4090u+ and 6000 product lines. Under the terms of the asset purchase agreement, MVTS has acquired all global inventory and goodwill, in addition to retaining key directors and employees.
Ron Maassen, of MVTS, describes the acquisition of the wafer prober assets as "a continuation of our strategy to provide the broadest range of semiconductor-related products and services to our customers. The Electroglas product lines are complementary to our core automated test equipment () and businesses and we intend to engage fully with the customer base to provide both sales and service solutions."
M.K. Low, a Zenovus founder and long term EG (Electroglas) employee, said, "It is with great pleasure I join the MVTS team. They are one of the only valued added who have the global infrastructure and product investment to maintain and expand product and service solutions for EG customers."
Wafer prober technology is used in both front and back-end semiconductor manufacturing segments. Probers enable electronic test and verification of the wafer manufacturing process, prior to singulation and assembly into packaged ICs.
provides premier equipment, service and support solutions to manufacturers worldwide. Delivering and supporting refurbished systems, upgrades and consumables to semiconductor manufacturers in more than 15 countries in North America, Europe and Asia, MVTS enables customers and OEM affiliates to extend the life and value of investments in semiconductor equipment and other technologies. Founded in 1994, MVTS is privately held and headquartered in Carlsbad, California. More information is available at .
Ross Martindale
VP of Marketing
MVTS Technologies
Phone: 760.930.8950
Fax: 760.930.9329
E-Mail:
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Datum: 08.01.2013 - 17:33 Uhr
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